index - PCM Accéder directement au contenu

Derniers dépôts

Rechercher

Nombre de documents

77

Nombre de notices

276

Mots-clés

A Thin films Spectroscopic ellipsometry Ablation laser Physical vapor deposition Sputtering Chalcogenide glass Mott insulators X-ray photoelectron spectroscopy Bixbyite Thin films CHLORINE PLASMAS Buffer Couple B1 Inorganic compounds Resistive switching Magnetron sputtering B2 Quaternary Carbon nanotubes Biofilms microbiens B2 Semiconducting indium compounds Chalcogenide CNTs’ collapse Functionalization Nanotubes Nanocomposite Atomic layer etching CaTiO3Pr^3^+ CIGSe Structure Transfert d'énergie Bipolar resistive switching BRS Calcined clay Capacitance A Chalcogenides Semiconductors AuCu alloy A3 Physical vapor deposition processes Transmission electron microscopy AlN Etching Biomasse Plasma etching B Chemical synthesis Colloidal solution Copper A Multilayers Oxides Kirkendall effect Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation Vanadium Sesquioxide Low-pressure plasma processing A1 Characterization Amorphous AZO thin films Chalcogenides Aluminium nitride 3 nm in size Selenization Carbon Nanotube NEXAFS XPS Alzheimer's disease BOMBARDMENT B2 Semiconducting alloys Optical properties Non-volatile memory Alloying TEM Biocapteurs Ambipolar material Anatase A-CNx Adsorption Avalanche breakdown SF 6 Carbon Amyloid precursor Titanium dioxide Mott insulator Films Chemical detection Plasmas froids PECVD Sol-gel Band gap Residual stress Cathepsin Thin film Applications industrielles CH4 C Photoelectron spectroscopy V2O3 Atomic force microscopy Band alignment Aryl-diazonium salts Scanning electron microscopy B3 Solar cells X-ray diffraction TiO2 Carbon nitride Chemical and biological sensors