Quadrature phase interferometer for high resolution force spectroscopy - ENS de Lyon - École normale supérieure de Lyon
Pré-Publication, Document De Travail Année : 2013

Quadrature phase interferometer for high resolution force spectroscopy

Pierdomenico Paolino
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Ludovic Bellon

Résumé

In this article, we present a deflection measurement setup for Atomic Force Mi- croscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the cantilever tip and a reference beam reflecting on the static base of the sensor. A design with very low environmental susceptibility and another allowing calibrated measurements on a wide spectral range are described. Both enable a very high resolution (down to 2.5E-15 m/√Hz), illustrated by a thermal noise measurement on an AFM cantilever. A quick review shows that our precision is equaling or outperforming the best results reported in the literature, but for a much larger deflection range, up to a few μm
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Dates et versions

ensl-00830294 , version 1 (04-06-2013)
ensl-00830294 , version 2 (08-08-2013)

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Pierdomenico Paolino, Felipe A. Aguilar Sandoval, Ludovic Bellon. Quadrature phase interferometer for high resolution force spectroscopy. 2013. ⟨ensl-00830294v1⟩
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